Ultrasharp tips for atomic force microscopy
Atomic force microscopes scan the surfaces of samples in the nanoworld. The fine probe tips of the microscope are expensive consumables. Amit Kumar Sachan and Renato Zenobi have adapted a microelectronic process, which is fast and cheap in producing probe tips from metal wire.
Professor Renato Zenobi and Dr. Amit Kumar Sachan (from left)
Contact / Links:
Professor Renato Zenobi, Zenobi Group
Patent pending (please contact ETH transfer for further information: )
Do you want to get more "News for Industry" stories?
external pageSubscribe to our newsletter
external pageFollow us on LinkedIn
Are you looking for research partners at ETH Zurich?
Contact ETH Industry Relations